semiconductor IC test handling system

talos – novel + easy-to-use device handling system

Applications in the semiconductor industry demand high-precision, innovative state-of-the-art technology [e.g. automated optical inspection (AOI), tri-temp testing, IC testing, sensor testing etc.] as well as reliable, predictable, and sustainable performance properties within clean and controlled test floor environments for premium quality control and assurance.

As a full-service systems integrator, esmo semicon offers a full suite of test equipment solutions, including automatic test equipment (ATE) as well as automated IC handling solutions, for the international semiconductor test industry.

We design, manufacture, and service novel device handling solutions, from basic sub-systems to comprehensive, turn-key automation systems, and entire platforms, as stand-alone components or as part of an integrated system.

esmo semicon IC testing/handling solutions are customized in order to satisfy OEM and/or the end user's specific requirements, depending on their respective lab/test environments.

talos - next generation, a novel + easy-to-use device handling system

talos – automating your microchip engineering test procedures

system key features

  • reliable and easy-to-use device handling system
  • -60 °C to +175 °C (-76 °F to +347 °F) device testing temperature with active thermal control system (ATC)  for cold/hot tests → tri-temp testing      
  • multiple test cycles at different test temperatures without user interaction
  • in combination with esmo phoenix cart, lowest test cell footprint in the market
  • modular system configurations as per your individual requirements
  • easily moveable, even by one person
  • standard docking interface for all testers
  • remote control via Ethernet
  • high MTBF values, low maintenance efforts

handling key features

  • highly accurate and reliable 4+1-axis portal pick-and-place robot system
  • manual tray or tube loading and unloading options
  • free pin1 orientation
  • high contact force of 450 N – higher contact force available on request
  • 15.6" widescreen HMI with multi-touch capability
  • integrated camera system for pick-and-place position teaching
  • FIFO or bin sort mode with free tray/tube assignment
  • RS232 or optional GPIB tester interfaces


The conversion kit consists of three modules, facilitating easy and quick replacement.

Talos IC Handler Optional Features

temperature control

active thermal control (ATC) option

cooling options

cooling options

electrical air chiller I LN2 heat exchanger I dual electrical air chiller I hybrid chiller

tube loading/unloading

for manual loading/unloading operations with tubes

tray loading/unloading

for manual loading/unloading operations with standard trays

tape loading/feeding

tape loading/feeding

for manual loading/unloading operations with tape

multi-site handling

dual- or quad-site thermal plunger for contacting multiple test sites in parallel

high contact force

high contact force

up to 800 N (instead of 450 N)

vision alignment

vision system option for small-device contact position correction (x/y/phi)

barcode reader

for identifying barcodes on ICs and assigning them to their corresponding test results

air dryer unit

for cold test operations to prevent chiller/heat exchanger icing as well as for chamber purge (in case no dry-air supply will be provided)

dual ionizer

closed-loop ionization for input/output area to protect sensitive parts from damage due to electro-static discharge

vacuum generator

vacuum is required for component pick+place (in case no external vacuum supply will be provided)

ESD cover

ESD cover

electro-statically dissipative acryl glass

external signal/status light

in addition to the standard, internal multi-color status LED illumination

BIB cleaning

facilitate, shorten, and enhance your cleaning processes


The talos platform, basing on a 4-axis portal, may be adapted to a virtually unlimited variety of customer demands –
we will design a concept for you, customized to your individual requirements.