EXPRESS configurator for your TH/prober/handler etc.

semiconductor IC test handler system

talos – novel + easy-to-use device handler system

talos – automating your microchip engineering test procedures

system key features

  • reliable and easy-to-use IC handling system
  • -60 °C to +175 °C (-76 °F to +347 °F) IC testing temperature with active thermal control system (ATC)  for cold/hot tests → tri-temp testing      
  • multiple test cycles at different test temperatures without user interaction
  • in combination with esmo phoenix cart, lowest IC test & handling cell footprint in the market
  • modular system configurations as per your individual requirements
  • easily moveable, even by one person
  • standard docking interface for all testers
  • remote control via Ethernet
  • high MTBF values, low maintenance efforts

handling key features

  • highly accurate and reliable 4+1-axis portal pick-and-place robot system
  • manual tray or tube loading and unloading options
  • free pin1 orientation
  • high contact force of 450 N – higher contact force available on request
  • 15.6" widescreen HMI with multi-touch capability
  • integrated camera system for pick-and-place position teaching
  • FIFO or bin sort mode with free tray/tube assignment
  • RS232 or optional GPIB tester interfaces

Talos IC Handler Optional Features

multi-site handling

dual- or quad-site thermal plunger for contacting multiple test sites in parallel

high contact force

up to 800 N (instead of 450 N)

tape loading/feeding

for manual loading/unloading operations with tape

tray loading/unloading

for manual loading/unloading operations with standard trays

tube loading/unloading

for manual loading/unloading operations with tubes

handler cooling options

electrical air chiller I LN2 heat exchanger I dual electrical air chiller I hybrid chiller

vision alignment

vision system option for small-device contact position correction (x/y/phi)

barcode reader

for identifying barcodes on ICs and assigning them to their corresponding test results

air dryer unit

for cold test operations to prevent chiller/heat exchanger icing as well as for chamber purge (in case no dry-air supply will be provided)

dual ionizer

closed-loop ionization for input/output area to protect sensitive parts from damage due to electro-static discharge

vacuum generator

vacuum is required for component pick+place (in case no external vacuum supply will be provided)

ESD cover

electro-statically dissipative acryl glass

external signal/status light

in addition to the standard, internal multi-color status LED illumination

BIB cleaning

facilitate, shorten, and enhance your cleaning processes

IC Handler temperature control

active thermal control (ATC) option